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新研电子元器件应用验证方法探讨

Author(s)：
邱秀玲谢扬

Publication Title：

Wen Yuan (Middle School Edition) 2021 No.02

Affiliations：
重庆航天职业技术学院重庆江北区 400021

Abstract：
本文首先对新研电子元器件的验证内容展开分析，包括功能验证、性能验证、工艺验证等，然后对新研电子元器件验证方法的使用现状进行阐述，如国产元器件适用性较低、验证规范的权威性较差、研制和应用结合度较低等，通过研究总体验证流程分析、应用验证方法分析、验证效果评价分析、验证信息共享评估等内容，以期能够提升验证结果的准确性，提升电子元器件分配的合理性。

Keywords：
功能验证；工艺验证；验证效果；验证方法

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[1] 邱秀玲,谢扬.新研电子元器件应用验证方法探讨[J].Wen Yuan (Middle School Edition),2021(02),.

文渊(中学版)

Wen Yuan (Middle School Edition)

Language: 中文

CN：11-9275/G

ISSN：2096-627X

Publication Frequency: 月刊

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