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Home > Wen Yuan (High School Edition) > 2023 No.02 > 数字集成电路测试技术应用分析

  • 数字集成电路测试技术应用分析

    Author(s)：

    邵俊程

    Publication Title：

    Wen Yuan (High School Edition) 2023 No.02

    Affiliations：

    山东省烟台南山学院

    Abstract：

    在现代制造和设计中，集成电路技术的应用，使得操作流程愈发复杂，需要不断优化集成电路测试。将数字集成电路测试技术应用其中，有助于测试效果和精准度的提升。鉴于此，基于数字集成电路测试技术的特点，通过分析数字集成电路测试系统的结构，从功能测试、直流参数测试两个角度出发，重点研究数字集成电路测试技术，深入剖析该技术的实际应用。

    Keywords：

    数字集成电路；测试技术；应用

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    [1] 邵俊程.数字集成电路测试技术应用分析[J].Wen Yuan (High School Edition),2023(02),.

文渊(高中版)
Wen Yuan (High School Edition)

Language: 中文

CN：11-9276/G

ISSN：2096-6288

Publication Frequency: 月刊

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